Microscopy applications stand as the most demanding of image quality and scientific integrity. The Pixon Method makes possible detection of fine structures that literally lie beyond the traditional physical limits set by the imaging instrument. Under even modest conditions, Pixon post processing extracts details 2 to 4 times finer than resolved in the raw data. With Its noise-reduction capability, sensitivity to low-contrast or weak image features can be increased by factors of up to 100. In a recent collaboration with Oak Ridge National Laboratory, Pixon image-processing technology was applied to data captured with the world's most powerful electron microscope, then used to demonstrate new concepts in nanoengineering of materials (see paper).
